| Model | DRK-W1 | DRK-W2 | DRK-W3 | DRK-W4 |
| Theoretical basis | Mie scattering theory | |||
| Particle size measurement range | 0.1-200um | 0.1-400um | 0.1-600um | 0.1-1000um |
| Light Source | Semiconductor refrigeration constant temperature control red light solid laser light source, wavelength 635nm | |||
| Repeatability error | <1% (standard D50 deviation) | |||
| Measurement error | <1% (standard D50 deviation, using national standard particle inspection) | |||
| Detector | 32 or 48 channel silicon photodiode | |||
| Sample cell | Fixed sample pool, circulating sample pool (built-in ultrasonic dispersion device) | |||
| Measurement analysis time | Less than 1 minute under normal conditions (from the beginning of the measurement to the display of the analysis results) | |||
| Output content | Volume and quantity differential distribution and cumulative distribution tables and graphs; various statistical average diameters; operator information; experimental sample information, dispersion medium information, etc. | |||
| Display method | Built-in 10.8-inch industrial-grade computer, which can be connected to keyboard, mouse, U disk | |||
| Computer system | WIN 10 system, 30GB hard disk capacity, 2GB system memory | |||
| power supply | 220V, 50 Hz | |||